RF Testing and Device Characterization Laboratory
The University of Texas at Dallas Applied Research Center (ARC) and the Texas Analog Center of Excellence (TxACE) provide unique RF testing, device characterization, and research capabilities for industry, academic, and government sponsors.
The Applied Research Center (ARC) fully supports sponsor requirements for:
- International Traffic in Arms Regulations (ITAR) Compliance
- Proprietary Data and Intellectual Property Protection
- Confidentiality and Non-Disclosure Agreements
- Quality Management Systems
All test, device, and sponsor data are protected and secured in the ARC’s ITAR-compliant facility. The ARC is specifically organized within the University to support sponsor work that is open, or restricted under regulatory or proprietary requirements.
When RF technical and design challenges arise that require reach-back to fundamental science and technology, access to the range of TxACE’s world-class analog and RF expertise is seamlessly available.
Device characterization supports the development of accurate models, optimizing the circuit design process, and minimizing the number of design iterations.
- LSVNA Measurements
- Active Load Pull (LP) 3 harmonics, up to 20GHz
- Passive LP to 26GHz
- (F0)Max 20GHz for Harmonic LP
- (F0)Max 50GHz for Fundamental Active LP
- Pulsed and DC IV up to 250V/10A
- Pulsed and CW S-Parameter
- Multiport S-Parameters (4-port)
- Up to 67GHz
- Up to +33dBm (+43dBm soon)
- On-Wafer, Fixtured or Coaxial
- Nonlinear measurements
- EMC chamber
- Laser trimming
- Temperature chamber
Contact us for further information.